• Rigaku ZSX Primus II XRF Spectrometer
  • PHI VersaProbe II Scanning XPS Microprobe
  • Rigaku SmartLab X-ray Diffractometer
  • MCC Floor Plan
  • Hitachi SU8230 UHR Cold Field Emission (CFE) SEM

Core News

January 7, 2019
The FEI Helios FIB SEM installation just started today and expected to be done by the end of January. We plan to spent Februry as machine testing time and we would like to...
November 27, 2018
On Novermber 8th and 9th, researchers from Yale, University of Connecticut, and University of Massachusetts gathered at the Yale West Campus Materials Characterization Core...
October 18, 2018
We are very glad to annouce that the FIB SEM (FEI Helios G4 UX) will arrive MCC in December this year. The machine will provide the capabilities including TEM sample...