XPS:
Analysis software
CasaXPS
CasaXPS processing software offers powerful analysis techniques for both spectral and imaging data. The system originally designed for XPS and Auger data now offers features covering a wide range of analytical techniques including ToF SIMS, dynamic SIMS and many more. For detailed introduction please visit the following links:
Click HERE to download the software
and send email request to Min Li (min.li at yale.edu) for username and license key as required for license update. The registration window can be found by clicking “Help” and selecting “About CasaXPS” in the dropdown menu in the software toolbar.
Additional resources:
- CasaXPS Manuals and Videos download
- CasaXPS Training Videos and Events
- Introduction to XPS (25 minutes in length)
- Curve Fitting and Sucrose (9:42 minutes in length)
- Introduction to Peak Models and Line Shapes (35 minutes in length)
XPS Analysis references:
- XPS Fitting Reference Pages (www.xpsfitting.com)
- XPS Simplified (xpssimplified.com)
- NIST X-ray Photoelectron Spectroscopy Database
- Practical guides for x-ray photoelectron spectroscopy: Quantitative XPS (J. Vac. Sci. Technol. A 38, 041201 (2020); doi: 10.1116/1.5141395)
- Introduction to topical collection: Reproducibility challenges and solutions with a focus on guides to XPS analysis (J. Vac. Sci. Technol. A 39, 021601 (2021); https://doi.org/10.1116/6.0000873)
- Introductory guide to backgrounds in XPS spectra and their impact on determining peak intensities (J. Vac. Sci. Technol. A 38, 063203 (2020))
- Webinar Curve Fitting in XPS by Physical Electronics (YouTube)
- Work Function measurement using UPS
- Work Function measurement using XPS
- Concerns on using C1s for spectral calibration (Angew. Chem. Int. Ed. 2020, 59, 5002 – 5006)
- UCDavis ChemWiki
- Analysis method comparison
- PHI Webinar Series: PHI Webinar Series: Beyond Chemical Composition Part I. Part I talks about the theory of the techniques
- PHI Webinar Series: PHI Webinar Series - Beyond Chemical Composition Part II. Part II has some practical recommendations for sample mounting and experimental considerations
- PHI Webinar Series: StrataPHI 2.0 - Updated Software for Multi-Layered Thin-Film Structure Analysis.
- PHI Webinar Series: Electronic Band Structure Characterization using LEIPS & UPS
XRD:
- Back‑to‑Basics tutorial: X‑ray diffraction of thin films, (Journal of Electroceramics (2021) 47:141–163).
- Tutorial on Powder X‑ray Diffraction for Characterizing Nanoscale Materials, (ACS Nano 2019, 13, 7359−7365)