FIB-SEM:
Following resources come from Kavli Nanoscience Institute at Caltech. We thank Matthew Hunt for his generous support.
- TEM sample preparation SOP (long version).
- TEM sample preparation SOP (short version).
- E-beam lighography with NPGS
- Cross section SOP
- Gallium Focused Ion Beam Concepts
XPS:
CasaXPS
CasaXPS processing software offers powerful analysis techniques for both spectral and imaging data. The system originally designed for XPS and Auger data now offers features covering a wide range of analytical techniques including ToF SIMS, dynamic SIMS and many more. For detailed introduction please visit the following link:
The registered XPS users can download the software from the following link
CasaXPS software download (new version released in 2023)
and send email request to Min Li (min.li at yale.edu) for username and license key as required for license update. The registration window can be found by clicking “Help” and selecting “About CasaXPS” in the dropdown menu in the software toolbar.
CasaXPS Manuals and Videos download
CasaXPS Training Videos and Events
Introduction to XPS (25 minutes in length)
Curve Fitting and Sucrose (9:42 minutes in length)
Introduction to Peak Models and Line Shapes (35 minutes in length)
Some useful links:
XPS Fitting Reference Pages (www.xpsfitting.com)
Webinar Curve Fitting in XPS by Physical Electronics (YouTube)
NIST X-ray Photoelectron Spectroscopy Database
XPS Simplified (xpssimplified.com)
UPS: Work Function measurement
Concerns on using C1s for spectral calibration (Angew. Chem. Int. Ed. 2020, 59, 5002 – 5006)