September 28, 2017
Mr. Atsushi Muto, the senior application scientist from Hitachi America was invited to present a lecture on the surface contamination of SEM imaging yesterday to our Core users. After the talk, he worked with users with samples on the instrument to provide onsite instructions on sample cleaning using the Zone cleaner provided by the company.
The UV ozone cleaner will stay in the Core for a week allowing our users to test their samples. The tool introduction brochure can be downloaded here.