November 15, 2016
Atsushi Muto, the senior application scientist from Hitachi will conduct a demo for this external bench-top tool that has been used for SEM/TEM surface cleaning. The typical “black box” in SEM imaging due to Electron Beam Induced Deposition (EBID) can be greatly reduced by prior cleaning in UV ozone environment. As a result, the removal of surface insulating carbon layer improves the imaging resolution. Here is an introductory page with a video of this instrument:
Mr. Muto also plans to work on any tough samples provided by our users. So it is a very opportunity for you to get some tips from him.